A look at the research into using metal-organic frameworks as photoresists for cutting-edge silicon etching, as ASML aims to move from EUV to X-ray lithography (Christopher Mims/Wall Street Journal)

Christopher Mims / Wall Street Journal : A look at the research into using metal-organic frameworks as photoresists for cutting-edge silicon etching, as ASML aims to move from EUV to X-ray lithography —  We are now one generation of technological alchemy away from the smallest possible silicon microchips